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Understanding robust and exploratory data analysis / edited by David C. Hoaglin, Frederick Mosteller, John W. Tukey.
— New York : Wiley, c1983. xvi, 447 p. : il. ; 24 cm. — (Wiley series in probability and mathematical statistics. Applied probability and statistics, ISSN 0271-6356)
Incluye referencias bibliográficas (p. 427-429) e índice.
Contenido: John D. Emerson and David C. Hoaglin, Stem-and-leaf displays — David C. Hoaglin, Letter values: a set of selected order statistics — John D. Emerson and Judith Strenio, Boxplots and batch comparison — John D. Emerson and Michael A. Stoto, Transforming data — John D. Emerson and David C. Hoaglin, Resistant lines for $y$ versus $x$ — John D. Emerson and David C. Hoaglin, Analysis of two-way tables by medians — Colin Goodall, Examining residuals — John D. Emerson, Mathematical aspects of transformation — David C. Hoaglin, Frederick Mosteller and John W. Tukey, Introduction to more refined estimators — James L. Rosenberger and Miriam Gasko, Comparing location estimators: trimmed means, medians, and trimean — Colin Goodall, $M$-estimators of location: an outline of the theory — Boris Iglewicz, Robust scale estimators and confidence intervals for location.
ISBN 0471097772
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