Applied logistic regression
David W. Hosmer, Jr., Stanley Lemeshow.
New York : Wiley, ©1989.
xiii, 307 págs. ; 24 cm.
Serie: Wiley series in probability and mathematical statistics. Applied probability and statistics
ISBN: 0471615536
"A Wiley-Interscience publication."
Incluye referencias bibliográficas (p. 291-300) e índice.