Linear and nonlinear models for the analysis of repeated measurements
Edward F. Vonesh, Vernon M. Chinchilli.
New York : Marcel Dekker, ©1997.
xii, 560 págs. ; 24 cm. + 1 diskette (3 1/2 in.)
Serie: Statistics: textbooks and monographs ; v. 154
ISBN: 0824782488
System requirements for accompanying computer disk: Program written using SAS, tested on IBM PS/2; may run on any PC or mainframe under DOS, Windows, or OS/2 with access to SAS.
Includes bibliographical references (p. 523-546) and indexes.