Understanding robust and exploratory data analysis
edited by David C. Hoaglin, Frederick Mosteller, John W. Tukey.
New York : Wiley, ©1983.
xvi, 447 págs. : ilustraciones ; 24 cm.
Serie: Wiley series in probability and mathematical statistics. Applied probability and statistics, ISSN 0271-6356
ISBN: 0471097772
Incluye referencias bibliográficas (p. 427-429) e índice.
Reseña: MathSciNet, 2001f:62007 (de la ed. de 1990)
Contenido
- John D. Emerson and David C. Hoaglin, Stem-and-leaf displays
- David C. Hoaglin, Letter values: a set of selected order statistics
- John D. Emerson and Judith Strenio, Boxplots and batch comparison
- John D. Emerson and Michael A. Stoto, Transforming data
- John D. Emerson and David C. Hoaglin, Resistant lines for $y$ versus $x$
- John D. Emerson and David C. Hoaglin, Analysis of two-way tables by medians
- Colin Goodall, Examining residuals
- John D. Emerson, Mathematical aspects of transformation
- David C. Hoaglin, Frederick Mosteller and John W. Tukey, Introduction to more refined estimators
- James L. Rosenberger and Miriam Gasko, Comparing location estimators: trimmed means, medians, and trimean
- Colin Goodall, $M$-estimators of location: an outline of the theory
- Boris Iglewicz, Robust scale estimators and confidence intervals for location.